The JEOL JEM-100CX II is a tungsten-filament 100kV transmission electron microscope. Digital imaging with Gatan Erlangshen ES500W camera, Gatan Digital Micrograph software.
High-resolution 200-kV LaB6 analytical transmission electron microscope system (NSF MRI #0821655). Energy dispersive X-ray spectrometry (EDS), scanning transmission electron microscopy (STEM), and parallel electron energy-loss spectrometry (EELS) for microanalysis. Magnifications of 2,000 to 1,500,000 times; optimal resolution 0.23 nm. Gatan dimple grinder and Gatan Precision Ion Polishing System (PIPS) for sample preparation.
