Nuclear magnetic resonance spectroscopy is used to study the structure of molecules, the interaction of various molecules, the kinetics or dynamics of molecules and the composition of mixtures of biological or synthetic solutions or composites. The size of the molecules analyzed can range from a small organic molecule or metabolite, to a mid-sized peptide or a natural product, all the way up to proteins of several tens of kDa in molecular weight. NMR nuclear spectroscopy complements other structural and analytical techniques such as X-ray, crystallography and mass spectrometry.
Agilent Technologies’ 5500 Atomic Force Microscope is a high-resolution imaging and measurement tool capable of imaging a sample’s 3-dimensional topography with atomic resolution. Advanced imaging modes including Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), and Phase Imaging allow for the study of various material properties. Both atomic force microscopy and scanning tunneling microscopy can be performed using this instrument. “A number of advantages over other technologies make AFM a favorite with researchers.
Perkin Elmer AAnalyst 100 Flame Atomic Absorption Spectrometer with Multi lamp turret and deuterium arc background correction. The AAnalyst 100 Atomic Absorption Spectrometer uses double-beam technology and performs automated single element analysis using flame absorption and flame emission techniques.
GE Inspection Technologies v/tome/x s 240kV microfocus X-ray computed tomography system with 180kV nanoCT X-ray and high-contrast digital flat panel detector for detailed non-destructive testing/3D reconstruction. NSF MRI# 1229417.
The atomic force microscope or scanning probe microscope is used to image the surface of a material from nanometer to atomic scale. This is accomplished by scanning the surface with a fine tip attached to a cantilever in contact or tapping mode. Lasers are used to measure the cantilever deflection during scanning. The AFM can also be used to map magnetic domains and conduct phase imaging on a material surface.
The EasyScan 2 Basic Atomic Force Microscopy (AFM) Package masters topography imaging, force spectroscopy and lithography in Static Force mode — the fundamental functions for surface measurement and modification. Along with its easy handling and positioning, and its capability of measuring on nearly any sample size and geometry, these features make this the ideal package for use in all entry level situations. Give students an EasyScan 2 Basic AFM Package, and they will learn about surface roughness, interatomic forces, hardness, and feedback loops.
NTEGRA Prima is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes.
JEOL's JSM-6010LA InTouchScopeTM Scanning Electron Microscope (SEM) is an analytical, low vacuum SEM featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The JSM-6010LA has the capability of qualitative and quantitative elemental analysis using simultaneous multiple live image and movie capture. The system also comes equipped with an infrared chamberscope and a 6 inch wafer stage.
Veeco Dimension Scanning Probe Microscope (SPM) is a next-generation measurement system that brings new levels of performance, functionality, and accessibility to nanoscale researchers. The Icon system incorporates temperature-compensating position sensors that enable extraordinary performance in a large-sample, closed-loop, 90-micron scan range system.
