Agilent Technologies’ 5500 Atomic Force Microscope is a high-resolution imaging and measurement tool capable of imaging a sample’s 3-dimensional topography with atomic resolution. Advanced imaging modes including Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), and Phase Imaging allow for the study of various material properties. Both atomic force microscopy and scanning tunneling microscopy can be performed using this instrument. “A number of advantages over other technologies make AFM a favorite with researchers.
The atomic force microscope or scanning probe microscope is used to image the surface of a material from nanometer to atomic scale. This is accomplished by scanning the surface with a fine tip attached to a cantilever in contact or tapping mode. Lasers are used to measure the cantilever deflection during scanning. The AFM can also be used to map magnetic domains and conduct phase imaging on a material surface.
NTEGRA Prima is a multifunctional device for performing the most typical tasks in the field of Scanning Probe Microscopy. The device is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes.