Tester

Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

AnaTech model STD-64

Event detectors are used to provide continuous daisy-chain circuit monitoring during reliability testing. Two 64-channel detectors are available in the Lab.

University Tag Number: 
173174
Availability: 
Contact Custodian for availability
  • Frederik Haring
Location
Research II
Room Number: 
112
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

The Lab-Volt Computer-Assisted 0.2-kW Electromechanical Training System (EMS), Model 8006, is a modern modular program that provides new opportunities for laboratory observations in the study of electric power technology. The program incorporates various techniques used in industry to generate and use electrical energy. The courseware covers power circuits, transformers, and common AC/DC machines. It is presented in two student manuals.

University Tag Number: 
176175
Availability: 
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  • Jeffrey Erickson
Location
Electrical Engineering
Room Number: 
105
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

Automated Battery Tester: Arbin Instruments model BT-2000

Battery capacity is a key performance metric for many electronic systems, and a limiting factor in many. This unit allows up to 12 simultaneous tests, with a total dissipation capacity of 1.9 kVA.

University Tag Number: 
173227
Availability: 
Contact Custodian for availability
  • Justin Hoey
Location
Research 1A
Room Number: 
1130
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

Performs electrical testing of packaged components and circuitry.

University Tag Number: 
171795
Availability: 
Contact Custodian for availability
  • Frederik Haring
Location
Research II
Room Number: 
126B
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

CheckSum Manufacturing Defects Analyzers (MDAs) provide the capability to quickly and easily test assemblies for common manufacturing defects such as incorrect, missing or misoriented components, and opens and shorts.

University Tag Number: 
171795
Availability: 
Contact Custodian for availability
  • Frederik Haring
Location
Research II
Room Number: 
126B
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

Cascade Microtech’s CM300xi with Contact Intelligence technology meets the measurement challenges brought on by extremely complex environments, such as unattended test at multiple temperatures. The CM300xi provides the lab automation capabilities needed to make critical precision electrical measurements for device characterization, high-volume engineering and extremely challenging applications. With renowned Cascade Microtech precision measurement expertise, you can confidently deliver accurate and reliable data for current and evolving device technologies.

University Tag Number: 
200162
Availability: 
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  • Debasis Dawn
Location
Electrical Engineering
Room Number: 
225
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

This "drop tester" imposes shock impulses of controlled amplitude and duration. Peak values can be as high as 100,000 g, with durations as short as 0.05 ms. A typical test condition for drop testing of electronic assemblies is a half-sine impulse of 1500 g for 0.5 ms. The machine provides continuity monitoring at nanosecond resolution in accordance with testing standards and industry practices. A smaller, Research Ops-built drop tower is also available.

University Tag Number: 
180760
Availability: 
Contact Custodian for availability
  • Frederik Haring
Location
Research II
Room Number: 
112
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

The HMS-3000 Hall Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors.

The HMS-3000 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc., at both 300K and 77K (room temperature and liquid nitrogen temperature).

University Tag Number: 
200164
Availability: 
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  • Danling Wang
Location
Batcheller Technology Ctr
Room Number: 
258
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

One of two:  Poor meter performance = lost yield

You should be getting 98% or better accuracy from your meters, but typical meters run at only 92%-97%. When each additional percentage point is worth another bushel or two for every acre, there’s plenty of room for improvement.

University Tag Number: 
195574
Availability: 
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  • Amitava Chatterjee
Location
Waldron Hall
Room Number: 
202
Inventory Classification
  • Sample Measurement and Analysis
  • Electrical
  • Tester

The PARSTAT 2273 is the ultimate potentiostat/galvanostat, boasting superior quality and high reliability. Its exceptional impedance capability, resolution, speed, high current, and high compliance voltage continues to be the standard against which all other systems are measured.

University Tag Number: 
174418
Availability: 
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  • Gordon Bierwagen
Location
Research 1
Room Number: 
172

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