The Mettler Toledo XPE603SN has a capacity of 610 grams with a readability of 1 milligram and comes with the innovative SmartPan™ with no draftshield. The Mettler Toledo XPE-S (small platform) precision balances incorporate the latest advances in weighing technology. The XPE-S incorporates the XPE detachable display with the innovative StatusLight™ color bar to indicate balance status. Also, all XPE-S balances incorporate a large color touch screen which makes viewing results and menu navigation a breeze.
Designed for use with the JEOL JSM-6490LV scanning electron microscope, where it permits live SEM observation/recording of visible changes in tested materials through failure. Also can be used with the optical microscope or as a data-logging test module, with no image display.
High-resolution 200-kV LaB6 analytical transmission electron microscope system (NSF MRI #0821655). Energy dispersive X-ray spectrometry (EDS), scanning transmission electron microscopy (STEM), and parallel electron energy-loss spectrometry (EELS) for microanalysis. Magnifications of 2,000 to 1,500,000 times; optimal resolution 0.23 nm. Gatan dimple grinder and Gatan Precision Ion Polishing System (PIPS) for sample preparation.
Designed for routine and research histopathology of up to 300 cassettes.
Proven technology combined with top quality components and Leica RemoteCare diagnostic provide superior instrument reliability.
Straightforward routine user operations by an intuitive user interface, color touch screen and a variety of “smart” features, such as Reagent Management System and quick start for commonly used programs, improve specimen quality and laboratory economy.