Vice President for Research and Creative Activity

Department Number: 
4000

Department Inventory

TA Instruments’ ARES rheometer offers unique separate motor and transducer technology for quality measurements. The ARES rheometer is capable of measuring stress independently of the applied shear deformation. The ARES rheometer is used to study various properties of viscoelastic matierals including loss modulus, storage modulus, relaxation modulus, and viscosity as a function of temperature, time, frequency or strain.
Applications
§ Provides information on viscosity
§ Determines loss and storage modulus

University Tag Number: 
173296
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • James Bahr
Location Description
Research I Addition
Room Number: 
1226
Inventory Classification

Ultima IV Powder X-Ray Diffactometer Rigaku’s Ultima IV is a multipurpose X-Ray Diffraction (XRD) system featuring patented cross beam optics technology for permanently mounted, permanently aligned, and user selectable parallel and focusing geometries. The Ultima IV X-Ray Diffractometer can perform many different measurements quickly.

University Tag Number: 
180726
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Greg Strommen
Location Description
Research II
Room Number: 
152C

The TI Q2000 is a research-grade DSC with superior performance in baseline flatness, precision, sensitivity, and resolution. Advanced Tzero® technology and multiple exclusive hardware and software features make the Q2000 powerful, flexible, and easy-to-use. Modulated DSC® and a reliable 50-position autosampler are available as options. An additional high-value feature is Platinum™ software, which permits automatic scheduling of tests designed to keep the Q2000 consistently in top operating condition.

University Tag Number: 
180727
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Greg Strommen
Location Description
Research I Addition
Room Number: 
1132

JEOL JSM-7600F high-resolution analytical scanning electron microscope Schottky in-lens field-emission gun Magnification range 25-1 million X Resolution 1 nm at 15 kV, 1.5 nm at 1 kV, 0.8 nm at 30 kV for STEM Thermo energy-dispersive X-ray analysis (silicon drift detector) Detectors: in-lens secondary, in-lens backscatter, low-angle backscatter, in-chamber secondary, STEM Selectable bias to specimen stage for beam deceleration and surface-data enhancement Hysitron PI-85 nanoindenter JEOL IB-09010CP cross-sectional polisher Cressington 208C high-resolution carbon coater

University Tag Number: 
184467
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
Location Description
USDA NCSL Lab
Room Number: 
EMC 119

JEOL's JSM-6010LA InTouchScopeTM Scanning Electron Microscope (SEM) is an analytical, low vacuum SEM featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The JSM-6010LA has the capability of qualitative and quantitative elemental analysis using simultaneous multiple live image and movie capture. The system also comes equipped with an infrared chamberscope and a 6 inch wafer stage.

University Tag Number: 
182233
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Greg Strommen
Location Description
Research II
Room Number: 
116

The Agilent B1500A Semiconductor Device Analyzer is the only parameter analyzer with the versatility to provide a wide range of device characterization capabilities, uncompromised measurement reliability, and effi cient and repeatable measurement. It supports all state-of-the-art measurements (IV, CV, and fast pulsed IV), giving it the ability to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.

University Tag Number: 
173266
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Aaron Reinholz
Location Description
Research II
Room Number: 
112

Cleans, rinses and dries products as large as 200 mm round. Process capability of 25 wafers per chamber.

University Tag Number: 
171551
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Greg Strommen
Location Description
Research II
Room Number: 
122C

Buehler’s SimpliMet 1000 automatic mounting press is used to mount specimens with thermosetting resins, including Phenolics, EpoMet, ProbeMet, KonductoMet I, and Diallyl Phthalate. Easy to change molds are offered in a full range of sample sizes from 1 to 2 (25 mm–50 mm).

University Tag Number: 
171788
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Frederik Haring
Location Description
Research II
Room Number: 
112

OGP Measuring System
Optically measures x, y and z dimensions of objects to 1 micron accuracy.

University Tag Number: 
171577
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Frederik Haring
Location Description
Research II
Room Number: 
126A

PV Measurements' solar cell QE systems can measure the spectral response of a wide variety of photoAll QEX7 solar cell QE systems include a xenon light source, monochromator, filters, and reflective optics to provide monochromatic light to a photovoltaic device while a broadband bias light illuminates the test device to simulate end-use conditions. A computer interfaces with the monochromator, signal conditioning equipment, and digital signal processing equipment; interprets signals; maintains calibration information; saves test data; and produces test reports.

University Tag Number: 
182195
Availability: 
Contact Custodian for availability
  • RCA Research Operations
  • Aaron Reinholz
Location Description
Research I Addition
Room Number: 
1134