• D8 Discover with GADDS Multipurpose X-Ray Diffractometer • Bruker AXS’ D8 Discover with GADDS is a multipurpose X-Ray Diffractometer capable of performing a variety of analytical techniques with minimal reconfiguration. X-Ray Diffraction (XRD) is an extremely powerful technique utilizing non-destructive analysis to study a wide range of materials. Research Ops in-house D8 Discover plays a significant role in the analysis and characterization of sputtered thinfilms and synthesized crystalline and semicrystalline materials. XRD is best known for phase identification of crystalline solids.
Dimension Elite 3D Printers use ABSplus™ modeling material, a production-grade thermoplastic that is durable enough to perform virtually the same as production parts. Models printed with Dimension 3D Printers have customer-proven toughness – from commercial sprayers tested at pressures up to 60 psi, to final parts on M1 tanks normally machined in aircraft-grade aluminum.
A SpeedmixerTM from Flacktek is used to mix difficult components such as extreme viscosity or paste-like materials. This device uses disposable mixing vessels of several sizes to mix in a non-contact fashion. Glass beads can also be added to provide a milling action to efficiently disperse powders into liquids.
Buehler’s EcoMet 3000 is a variable speed grinder-polisher with an 8 (203mm) low profile aluminum platen and a Buehler universal mount. Platen speed is variable from 10 to 500 rpm. Percent Load display shows the amount of load on the motor. A built-in center mount facilitates use of the AutoMet Power Head with either wheel. The instrument is designed for sample preparation applications which require two grinding-polishing stations.
•Surface finishes can be achieved down to a mirror finish depending upon material and technique.
Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098). Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis. Remotely operable for K-12 students.
J. A. Woollam M-88 Ellipsometer
Determines multilayer thicknesses, optical constants, crystallinity, surface and interfacial roughness. Has a 300 mm programmable sample stage with motorized rotation and 88 wavelengths from 280 to 760 nm. Completes full spectrum measurement in 1/20 s.
Temperature cycling is similar to temperature shock testing, with the difference being that temperature cycling has slower transitions between temperature extremes. Two chambers were acquired; the larger unit is appropriate for cycling printed circuit board assemblies while the small unit is appropriate for individual devices. Both chambers provide standards-compliant conditions for air-to-air testing.