Scanning CCD camera designed to create high quality images of 2-D DIGE gels. It’s high resolution and precise motion control, produces accurate multichannel images of Cy2-, Cy3, and Cy5-labeled gels. The system is also designed to image other fluorescent gel applications, and can be used with ECL Plex Western Blotting System. It is controlled from the Ettan DIGE Imager software, and can be set up for a variety of gel formats.
This "drop tester" imposes shock impulses of controlled amplitude and duration. Peak values can be as high as 100,000 g, with durations as short as 0.05 ms. A typical test condition for drop testing of electronic assemblies is a half-sine impulse of 1500 g for 0.5 ms. The machine provides continuity monitoring at nanosecond resolution in accordance with testing standards and industry practices. A smaller, Research Ops-built drop tower is also available.
Dimple grinding offers a fast and reliable mechanical method of pre-thinning to near electron transparency (in some cases to electron transparency) greatly reducing ion milling times and uneven thinning. Dimple grinding also offers a means of producing quality TEM specimens having a large central area only a few microns thick surrounded by a robust outer rim. This eliminates special handling techniques for fragile specimens.
Precision Ion Polishing System (PIPS™) The PIPS™ is a user-friendly precision ion polisher designed to produce high quality, TEM specimens with minimal effort. The PIPS™ is a dedicated low angle ion polishing unit with high milling rates. The standard milling angle is 4°.
GE Inspection Technologies v/tome/x s 240kV microfocus X-ray computed tomography system with 180kV nanoCT X-ray and high-contrast digital flat panel detector for detailed non-destructive testing/3D reconstruction. NSF MRI# 1229417.
Features: • Virtual Rescanning Mode (VRM)™ stores comprehensive data and enables you to perform a complete analysis of a sample, even when it is no longer available • TurboSpeed™ provides faster imaging speeds at high frequencies with up to 2.5X increased image acquisition speed with high pixel densities • Digital Image Analysis (DIA)™ uses advanced algorithms to quantify the acoustic data and allows you to set accurate, automatic, accept/reject criteria • ESD safe and Clean Room ready • Open access scanning area makes loading and unloading easy and is capable of scanning two JEDEC trays or