Infiniium oscilloscopes provide the high performance specifications and features you need for today’s demanding jobs. With bandwidths up to 2.25 GHz, sample rates up to 8 GSa/s, and probes with up to 4 GHz bandwidths, Infiniium can view your fastest signals. Powerful triggering and analysis make it easy to capture and analyze your waveforms. Display and math features, such as color-grade persistence and histograms, let you easily view and isolate signal problems.
Buehler’s IsoMet 4000 Linear Precision Saw is designed for cutting various types of materials with minimal sample deformation. The IsoMet 4000 provides users with a precision sectioning tool capable of cutting virtually any material, including brittle and ductile metals, ceramics, composites, cements, laminates, plastics, electronic components and biomaterials. Additionally, a built-in coolant pump minimizes sample deformation by reducing heat build-up.
Produces a clean polished cross section of almost any material at 90 degrees to the sample surface--ideal for measurement of multilayered structures. Useful for difficult-to-polish soft materials (Cu, Al, Au, solder, polymers) as well as difficult-to-cut hard materials (ceramic, glass, Si) and composites.
K-Alpha is a fully integrated and compact X-ray photoelectron spectrometer that has a high throughput and provides the highest available performance/cost capability with a small footprint • UHV Condition at better than 5 x 10-9 mbar. • Maximum sample size of 60×60x20mm • X-ray Monochromator: • Ag 3d5/2 peak with full width at half-maximum energy resolution of 0.50 eV. • Spot size of 30µm to 400µm • Charge compensation by electrons and low energy ions (Ar+).
KLA Tencor P-15 Profilometer Max Wafer Size: 8” General Description: The KLA-Tencor P-15 Profiler is a highly sensitive surface profiler that measures step height, roughness, and waviness on sample surfaces. Roughness can be measured with up to a 0.5 Å resolution over short distances. Waviness can be measured over the entire surface of a sample. The P-15 system uses stylus-based scanning to achieve high resolution and can correlate local submicron features with global surface measurements. It has a scan area of 200 X 200 mm.
Contact surface profiler capable of measuring step height, roughness, waviness and other surface characteristics. Has a vertical measurement range from under 100 Å to 300 µm. Has a scan length of 8.1” and a scan speed of 1 to 25 µm/s. Also has a programmable force range of 1 to 50 mg.
KLA-Tencor’s P-15 Longscan Contact Stylus Profiler is capable of measuring the roughness and waviness of a sample’s surface. The P-15 can also measure positive and negative step height features with a high degree of accuracy and precision. Both 2D and 3D scan profiles can be obtained. The P-15 is equipped with a MicroHead IIxr scanner that has a 1mm vertical range and is capable of scanning at forces between 0.5–50mg. The maximum horizontal scan length is 200mm.