Scott Payne

Ion Beam Milling

• GATAN Precision Ion Polishing System
• JOEL IB-09010CP Ion Beam Cross Section Polisher

Dynamic

• PI 85 SEM PICO INDENTOR SYSTEM
• Tensile Stage, Deben MICROTEST 200N

X-ray

• Ultradry EDS Detector

Mechanical

• GATAN Model 656 Dimple Grinder

Scanning Transmission

• Transmission Electron Microscope, LaB6, JEOL JEM-2100

Transmission

• Transmission Electron Microscope, JEOL JEM-100CX II
• Transmission Electron Microscope, LaB6, JEOL JEM-2100

Sputterer

• Cressington 108Auto Sputter Coater
• Cressington 208C Carbon Coating System

Other Cutting

• PTXL ULTRAMICROTOME KNIFE