PROBE, SCANNING KELVIN SKP100

The SKP100 Scanning Kelvin Probe sets a new standard in surface science measurements. The Kelvin Probe is a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a sample probe. The technique operates using a vibrating capacitance probe. Through a swept backing voltage, the work function difference is measured between the scanning probe reference tip and sample surface. What makes the SKP an invaluable instrument is well established principles of direct correlation between work function and surface condition. It’s ability to make measurements in a humid or even gaseous environment allows it to make measurements that were previously impossible add to its value.