NANOSCOPE IIIA MICROSCOPE
Inventory Classification
The atomic force microscope or scanning probe microscope is used to image the surface of a material from nanometer to atomic scale. This is accomplished by scanning the surface with a fine tip attached to a cantilever in contact or tapping mode. Lasers are used to measure the cantilever deflection during scanning. The AFM can also be used to map magnetic domains and conduct phase imaging on a material surface.
University Tag Number:
168277
Serial Number:
1844EX
Availability:
Contact Custodian for availability
Location
Ehly Hall
Room Number:
120
Acquisition Date:
March 1, 2004