Agilent Technologies’ 5500 Atomic Force Microscope is a high-resolution imaging and measurement tool capable of imaging a sample’s 3-dimensional topography with atomic resolution. Advanced imaging modes including Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), and Phase Imaging allow for the study of various material properties. Both atomic force microscopy and scanning tunneling microscopy can be performed using this instrument. “A number of advantages over other technologies make AFM a favorite with researchers. The chief difference between AFM and other microscopy techniques is the measure of resolution. While electron and optical microscopes provide a standard two-dimensional horizontal view of a sample's surface, AFM also provides a vertical view. The resulting images show the topography of a sample's surface. And while electron microscopes work in a vacuum, most AFM modes work in ambient or liquid environments. AFM does not require any special sample preparation that could damage the sample or prevent its reuse” (Agilent Technologies). Applications Electrochemistry, Life Science, Materials Science, Nanografting, Nanolithography, & Polymers Imaging Modes Contact Mode, Acoustic AC Mode, MAC Mode, Phase Imaging, STM, LFM, EFM, MFM, Force Modulation, & Current Sensing Features Acoustic and vibration isolation chamber Environmental chamber Open and closed loop X,Y, and Z scanners Stage allows 20x20mm samples to be imaged Scanner Range: 90x90x9 um scanner (x,y,z) range Z (height) Resolution: 0.2nm

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Research II
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July 29, 2005