ELLIPSOMETER
Inventory Classification
J. A. Woollam M-88 Ellipsometer
Determines multilayer thicknesses, optical constants, crystallinity, surface and interfacial roughness. Has a 300 mm programmable sample stage with motorized rotation and 88 wavelengths from 280 to 760 nm. Completes full spectrum measurement in 1/20 s.
University Tag Number:
173260
Serial Number:
98-0345
Availability:
Contact Custodian for availability
Location
Research II
Room Number:
122B
Acquisition Date:
May 29, 2007