GEN5 C-SAM SYSTEM

Features: • Virtual Rescanning Mode (VRM)™ stores comprehensive data and enables you to perform a complete analysis of a sample, even when it is no longer available • TurboSpeed™ provides faster imaging speeds at high frequencies with up to 2.5X increased image acquisition speed with high pixel densities • Digital Image Analysis (DIA)™ uses advanced algorithms to quantify the acoustic data and allows you to set accurate, automatic, accept/reject criteria • ESD safe and Clean Room ready • Open access scanning area makes loading and unloading easy and is capable of scanning two JEDEC trays or a 300mm wafer • Inertially Balanced Linear Motor Scanner with counterweight to minimize vibrations and ensure optimal scanning results • Multi-Language OS and Visual Acoustics™ Interface allows technicians and operators to work in their native language. Includes English, Chinese and Japanese

University Tag Number: 
178577
Serial Number: 
4033
Availability: 
Contact Custodian for availability
Location
Research II
Room Number: 
112
Acquisition Date: 
October 29, 2008