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Transmission Electron Microscope, LaB6, JEOL JEM-2100

Inventory Classification

High-resolution 200-kV LaB6 analytical transmission electron microscope system (NSF MRI #0821655).  Energy dispersive X-ray spec­trometry (EDS), scanning transmission electron microscopy (STEM), and parallel electron energy-loss spectrometry (EELS) for micro­analysis.  Mag­ni­fications of 2,000 to 1,500,000 times; optimal resolution 0.23 nm.  Gatan dimple grinder and Gatan Precision Ion Polishing System (PIPS) for sample preparation.

University Tag Number: 
179927
Serial Number: 
EM17420030
Availability: 
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number: 
EMC116-117
Acquisition Date: 
March 19, 2010