CASCADE 12000 PROBE STATION

High-precision wafer probe station for device characterization and modeling Re-configurable for multiple applications: DC, RF, mmW, FA, WLR and more Excellent EMI shielding for low noise measurement Wide range of temperature options from -60 to 300°C and higher

University Tag Number: 
182197
Serial Number: 
5638
Availability: 
Contact Custodian for availability
Location
Research II
Room Number: 
112
Acquisition Date: 
September 19, 2010