VEECO DIMENSION SPM SYSTEM

Veeco Dimension Scanning Probe Microscope (SPM) is a next-generation measurement system that brings new levels of performance, functionality, and accessibility to nanoscale researchers. The Icon system incorporates temperature-compensating position sensors that enable extraordinary performance in a large-sample, closed-loop, 90-micron scan range system. In addition to superior resolution, the Icon provides higher scan speeds without loss of image quality, a high-resolution camera and X-Y positioning for more efficient sample navigation, and the latest version of NanoScope software with intuitive workflow and default experiment modes.

University Tag Number: 
183605
Serial Number: 
3939D3040
Availability: 
Contact Custodian for availability
Location
Batcheller Technology Ctr
Room Number: 
258
Acquisition Date: 
May 19, 2010