SCANNING ELECTRON MICROSCOPE

JEOL JSM-7600F high-resolution analytical scanning electron microscope Schottky in-lens field-emission gun Magnification range 25-1 million X Resolution 1 nm at 15 kV, 1.5 nm at 1 kV, 0.8 nm at 30 kV for STEM Thermo energy-dispersive X-ray analysis (silicon drift detector) Detectors: in-lens secondary, in-lens backscatter, low-angle backscatter, in-chamber secondary, STEM Selectable bias to specimen stage for beam deceleration and surface-data enhancement Hysitron PI-85 nanoindenter JEOL IB-09010CP cross-sectional polisher Cressington 208C high-resolution carbon coater

University Tag Number: 
184467
Serial Number: 
SM17600066
Availability: 
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number: 
EMC 119
Acquisition Date: 
October 12, 2010