JOEL IB-09010CP Ion Beam Cross Section Polisher

Produces a clean polished cross section of almost any material at 90 degrees to the sample surface--ideal for measurement of multilayered structures. Useful for difficult-to-polish soft materials (Cu, Al, Au, solder, polymers) as well as difficult-to-cut hard materials (ceramic, glass, Si) and composites.

University Tag Number: 
184470
Serial Number: 
IB4090008
Availability: 
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number: 
EMC 107
Acquisition Date: 
June 30, 2010