GE X-ray MicroCT Scanner System

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Inventory Classification

GE Inspection Technologies v|tome|x s 240kV microfocus X-ray computed tomography system with additional 180kV HPNF submicron X-ray tube (nanoCT) and high-contrast digital flat panel detector.

University Tag Number: 
191645
Availability: 
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number: 
EM LAB
Acquisition Date: 
June 30, 2013