GE X-ray MicroCT Scanner System
Inventory Classification
GE Inspection Technologies v|tome|x s 240kV microfocus X-ray computed tomography system with additional 180kV HPNF submicron X-ray tube (nanoCT) and high-contrast digital flat panel detector.
University Tag Number:
191645
Availability:
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number:
EM LAB
Acquisition Date:
June 30, 2013