GE Micro CT Scanner System
Inventory Classification
GE Inspection Technologies v/tome/x s 240kV microfocus X-ray computed tomography system with 180kV nanoCT X-ray and high-contrast digital flat panel detector for detailed non-destructive testing/3D reconstruction. NSF MRI# 1229417.
University Tag Number:
191645
Availability:
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number:
EM Lab 112
Acquisition Date:
June 30, 2013