HMS-3000 Hall Measurement System
Inventory Classification
The HMS-3000 Hall Measurement System is a complete system for measuring the resistivity, carrier concentration, and mobility of semiconductors.
The HMS-3000 includes software with I-V curve capability for checking the ohmic integrity of the user made sample contacts. The systems can be used to characterize various materials including semiconductors and compound semiconductors (N Type & P Type) such as Si, Ge, SiGe, SiC, GaAs, InGaAs, InP, GaN, ZnO, TCOs, metals, etc., at both 300K and 77K (room temperature and liquid nitrogen temperature).
University Tag Number:
200164
Availability:
Contact Custodian for availability
Location
Batcheller Technology Ctr
Room Number:
258
Acquisition Date:
May 31, 2017