WINTERSTEIGER developed a drill box for its plot seeder Plotseed XL. It is suitable for the bulk seed sowing of plots at the edge of fields and larger areas at the edge of test fields, and can also sow both small grass seed and large-grain legumes. Up to 12 rows can be filled and they can be filled separately, as the chambers in the drill box are separated from each other.
■Variable sowing rate thanks to a continuously adjustable gear system
■A wide range of uses – fine seeds to large-grain legumes
The X-Cite 120 Fluorescence Illumination System gives you high quality excitation light without heat transference to your specimen. This fluorescence illumination system uses a pre-aligned metal halide which gives an exceptionally bright illumination, high efficiency and power. Easy to set up and use, the X-cite 120 has straight forward controls, and snap in lamp replacement.
This 2-D detector provides enhanced capabilities for phase ID, phase quantification, texture, stress, small angle x-ray scattering, high-throughput screening, µXRD, and mapping. The instrument can play a significant role in analysis and characterization of many types of materials for research and educational objectives.
A diffractometer is a measuring instrument for analyzing the structure of a material from the scattering pattern produced when a beam of radiation or particles (such as X-rays or neutrons) interacts with it.
XD7600NT X-ray Imaging System DAGE Precision Industries’ XD7600NT X-ray Imaging System is a state-of-the-art inspection tool with submicron feature recognition. X-ray inspection is a critical component in surface mount technology (SMT) and chip scale packaging (CSP). X-ray inspection for SMT processes include solder joints, BGA placement, and solder bridging, while inspection for CSP processes include examination of wire bond connections and wire shorts.
Free-standing unit with integrated cart, motorized Z-axis, auto focus, X-Y beam positioning system with RACER™ motion technology, self-adjusting spring loaded sealed bearings, stationary processing table, Quick Change Laser Cartridge™ shielded optics, interchangeable focusing optics, flash upgradeable electronics, job complete indicator, system status indicator, relocatable origin, enhanced vector cutting, 3D engraving and rubber stamp mode. 32” x 18” work area.
The FOSS Rapid Content® Analyzer, based on XDS near-infrared technology, provides the next generation of dedicated NIR analysis for rapid non-destructive measurements of solid and liquid chemical and pharmaceutical formulations.
Instead of using a mosaic pattern of hyperspectral filters, this camera features a line-wise arrangement of 150 HSI bands. Thanks to the high frame rate of the image sensor, this camera enables detailed and crisp captures of moving objects at multiple wavelengths. Thereby the objects can be moved orthogonally to the horizontal color filters of a mounted camera, e.g. on a conveyor belt, or the camera can be attached e.g. to a UAV, which flies over a large area. The visual and near-infrared (NIR) spectrum of this camera is especially relevant in agriculture.
X-ray photoelectron spectroscopy (XPS) scanning microprobe analysis provides information about quantitative elemental and chemical states in surfaces and thin film structures. XPS is used in applications including polymers, metals, thin films, nanomaterials, semiconductors, magnetic storage media, display technology, biomedical devices and catalysts.