Low Frequency Characterization

Inventory Classification
  • Sample Measurement and Analysis
  • Electronic
  • Low Frequency Characterization

High-precision wafer probe station for device characterization and modeling Re-configurable for multiple applications: DC, RF, mmW, FA, WLR and more Excellent EMI shielding for low noise measurement Wide range of temperature options from -60 to 300°C and higher

University Tag Number: 
182197
Availability: 
Contact Custodian for availability
  • Greg Strommen
Location
Research II
Room Number: 
112