The Recharge Center’s Quantachrome Autosorb-1 gas sorption system is available for use. Volume-pressure data measured by the system is converted by the software into BET surface area (single and/or multipoint), Langmuir surface area, adsorption and/or desorption isotherms, pore size and surface area distributions, micropore volume and surface area. The system operates by measuring the quantity of gas adsorbed onto or desorbed from a solid surface at some equilibrium vapor pressure by the static volumetric method.
Q-Lab’s QUltraviolet/Solar Eye (QUV/SE) uses fluorescent UV lamps to reproduce months or years worth of damaging effects of sunlight and dew in only a few days or weeks.
The QUV/SE features a Solar Eye Irradiance Controller that continually monitors and maintains a desired level of irradiance for precise control of UV light intensity assuring reproducible test results. The QUV/SE can produce cycles of wetness alternating with UV to create a situation similar to nature.
Symyx Rapid Gel Permeation Chromatography (GPC)TM is a high throughput method for characterizing polymer molecular weight and molecular weight distribution. This system includes a sample preparation system that is used to dilute the polymer samples and inject the samples into the GPC system. The sample preparation system has heated liquid dispensing pipettes for handling viscous polymers. The GPC system uses high-speed columns and an evaporative light scattering detector. Samples can be analyzed in as little as 10 minutes.
The E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. It will provide innovations in R&D of components and circuit designers who evaluate components in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.
TA Instruments’ ARES rheometer offers unique separate motor and transducer technology for quality measurements. The ARES rheometer is capable of measuring stress independently of the applied shear deformation. The ARES rheometer is used to study various properties of viscoelastic matierals including loss modulus, storage modulus, relaxation modulus, and viscosity as a function of temperature, time, frequency or strain.
§ Provides information on viscosity
§ Determines loss and storage modulus
Ultima IV Powder X-Ray Diffactometer Rigaku’s Ultima IV is a multipurpose X-Ray Diffraction (XRD) system featuring patented cross beam optics technology for permanently mounted, permanently aligned, and user selectable parallel and focusing geometries. The Ultima IV X-Ray Diffractometer can perform many different measurements quickly.
The TI Q2000 is a research-grade DSC with superior performance in baseline flatness, precision, sensitivity, and resolution. Advanced Tzero® technology and multiple exclusive hardware and software features make the Q2000 powerful, flexible, and easy-to-use. Modulated DSC® and a reliable 50-position autosampler are available as options. An additional high-value feature is Platinum™ software, which permits automatic scheduling of tests designed to keep the Q2000 consistently in top operating condition.
JEOL's JSM-6010LA InTouchScopeTM Scanning Electron Microscope (SEM) is an analytical, low vacuum SEM featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The JSM-6010LA has the capability of qualitative and quantitative elemental analysis using simultaneous multiple live image and movie capture. The system also comes equipped with an infrared chamberscope and a 6 inch wafer stage.
The Agilent B1500A Semiconductor Device Analyzer is the only parameter analyzer with the versatility to provide a wide range of device characterization capabilities, uncompromised measurement reliability, and effi cient and repeatable measurement. It supports all state-of-the-art measurements (IV, CV, and fast pulsed IV), giving it the ability to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device.