Nanosurf EasyScan 2 Basic
The EasyScan 2 Basic Atomic Force Microscopy (AFM) Package masters topography imaging, force spectroscopy and lithography in Static Force mode — the fundamental functions for surface measurement and modification. Along with its easy handling and positioning, and its capability of measuring on nearly any sample size and geometry, these features make this the ideal package for use in all entry level situations. Give students an EasyScan 2 Basic AFM Package, and they will learn about surface roughness, interatomic forces, hardness, and feedback loops. Give teachers an EasyScan 2 Basic AFM Package, and they will teach their class about ultra large-scale integration, corrosion, surface tension, and the limitations of optics. Give a small or medium enterprise an EasyScan 2 Basic AFM Package, and they will have a tool to inspect their surfaces that can upgrade its measurement capabilities as their technology advances, a flexibility unique to the EasyScan 2 system.