Free Fall Shock Machine
This "drop tester" imposes shock impulses of controlled amplitude and duration. Peak values can be as high as 100,000 g, with durations as short as 0.05 ms. A typical test condition for drop testing of electronic assemblies is a half-sine impulse of 1500 g for 0.5 ms. The machine provides continuity monitoring at nanosecond resolution in accordance with testing standards and industry practices. A smaller, Research Ops-built drop tower is also available.
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Contact Custodian for availability
June 15, 2009