X-ray

Inventory Classification
  • Materials Characterization
  • Diffraction
  • X-ray

• D8 Discover with GADDS Multipurpose X-Ray Diffractometer • Bruker AXS’ D8 Discover with GADDS is a multipurpose X-Ray Diffractometer capable of performing a variety of analytical techniques with minimal reconfiguration. X-Ray Diffraction (XRD) is an extremely powerful technique utilizing non-destructive analysis to study a wide range of materials. Research Ops in-house D8 Discover plays a significant role in the analysis and characterization of sputtered thinfilms and synthesized crystalline and semicrystalline materials. XRD is best known for phase identification of crystalline solids.

University Tag Number: 
173004
Availability: 
Contact Custodian for availability
  • Aaron Reinholz
Location
Research II
Room Number: 
152C
Inventory Classification
  • Materials Characterization
  • Diffraction
  • X-ray

This 2-D detector provides enhanced capabilities for phase ID, phase quantification, texture, stress, small angle x-ray scattering, high-throughput screening, µXRD, and mapping.   The instrument can play a significant role in analysis and characterization of many types of materials for research and educational objectives.

University Tag Number: 
173004
Availability: 
Contact Custodian for availability
  • Greg Strommen
Location
Research II
Room Number: 
152C
Inventory Classification
  • Materials Characterization
  • Diffraction
  • X-ray

A diffractometer is a measuring instrument for analyzing the structure of a material from the scattering pattern produced when a beam of radiation or particles (such as X-rays or neutrons) interacts with it.

University Tag Number: 
157650
Availability: 
Contact Custodian for availability
  • Angel Ugrinov
Location
Dunbar Hall
Room Number: 
159

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