Tensile Stage, Deben MICROTEST 200N
Inventory Classification
Designed for use with the JEOL JSM-6490LV scanning electron microscope, where it permits live SEM observation/recording of visible changes in tested materials through failure. Also can be used with the optical microscope or as a data-logging test module, with no image display.
University Tag Number:
174606+
Availability:
Contact Custodian for availability
Location
USDA NCSL Lab
Room Number:
EM Lab 111
Acquisition Date:
January 11, 2006