Core Labs

Department Number: 
4350

Department Inventory

Inventory Classification

Stereolithography technology - - liquid resins polymerized by a precision laser - - creates exceptionally detailed models, an efficient way to produce prototypes or limited-run parts up to 145 x 145 x 175mm (5.8 x 5.8 x 7 inches) with layer resolution of 25-100µm.  Accepts .STL and .OBJ file formats.  

University Tag Number: 
191645+
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
Location Description
USDA NCSL
Room Number: 
EM Lab 111

The HybEZ™ Hybridization System (110V) is designed to conduct hybridization and incubation steps in ACD’s RNAscope® assay. The system can hold up to twenty standard microscope slides on the slide rack. The oven provides the necessary temperature control and humidity required for optimal performance of RNAscope manual assay.The unit has an advanced PID temperature controller that provides stable and accurate chamber temperatures from ambient plus 10˚C to 75˚C.

University Tag Number: 
201737
Availability: 
Contact Custodian for availability
  • Core Labs
  • Pawel Borowicz
Location Description
Hultz Hall
Room Number: 
135

Cressington 108 Sputter Coaters are ideal for routine sample preparation. Compact, economical and simple to operate, they offer rapid pumpdown times, fine-grain coatings and negligible sample heating. Cool, fine-grain sputtering is achieved with a very efficient dc magnetron head. A quick-change target method allows a range of metals to be used. The safety interlocked sputtering supply is fully variable and setting the sputter current is not influenced by vacuum level.

University Tag Number: 
194015
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
  • Scott Payne
Location Description
USDA NCSL Lab
Room Number: 
107

The Cressington Coater offers real solutions to the problems encountered when coating difficult samples for FE-SEM.  To minimize the effects of grain size the unit offers a full range of coating materials and gives unprecedented control over thickness and deposition conditions. To minimize charging effects the stage design and wide range of operating pressures allows precise control of the uniformity and conformity of the coating. The HIGH/LOW chamber configuration allows easy adjustment of working distance.

University Tag Number: 
184473
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
  • Scott Payne
Location Description
USDA NCSL Lab
Room Number: 
EMC 107

Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098).  Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis.  Remotely operable for K-12 students.

University Tag Number: 
174606
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
Location Description
USDA NCSL Lab
Room Number: 
EM LAB 120

Dimple grinding offers a fast and reliable mechanical method of pre-thinning to near electron transparency (in some cases to electron transparency) greatly reducing ion milling times and uneven thinning.  Dimple grinding also offers a means of producing quality TEM specimens having a large central area only a few microns thick surrounded by a robust outer rim. This eliminates special handling techniques for fragile specimens.

University Tag Number: 
179924
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
  • Scott Payne
Location Description
USDA NCSL lab
Room Number: 
EMC 107

Precision Ion Polishing System (PIPS™) The PIPS™ is a user-friendly precision ion polisher designed to produce high quality, TEM specimens with minimal effort. The PIPS™ is a dedicated low angle ion polishing unit with high milling rates. The standard milling angle is 4°.

University Tag Number: 
179925
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
  • Scott Payne
Location Description
USDA NCSL Lab
Room Number: 
EMC 107

GE Inspection Technologies v/tome/x s 240kV microfocus X-ray computed tomography system with 180kV nanoCT X-ray and high-contrast digital flat panel detector for detailed non-destructive testing/3D reconstruction.  NSF MRI# 1229417.  

University Tag Number: 
191645
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
Location Description
USDA NCSL Lab
Room Number: 
EM Lab 112
Inventory Classification

GE Inspection Technologies v|tome|x s 240kV microfocus X-ray computed tomography system with additional 180kV HPNF submicron X-ray tube (nanoCT) and high-contrast digital flat panel detector.

University Tag Number: 
191645
Availability: 
Contact Custodian for availability
  • Core Labs
  • Scott Payne
  • Jayma Moore
Location Description
USDA NCSL Lab
Room Number: 
EM LAB

Produces a clean polished cross section of almost any material at 90 degrees to the sample surface--ideal for measurement of multilayered structures. Useful for difficult-to-polish soft materials (Cu, Al, Au, solder, polymers) as well as difficult-to-cut hard materials (ceramic, glass, Si) and composites.

University Tag Number: 
184470
Availability: 
Contact Custodian for availability
  • Core Labs
  • Jayma Moore
  • Scott Payne
Location Description
USDA NCSL Lab
Room Number: 
EMC 107