Electron/Ion Microscopy

Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning

Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098).  Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis.  Remotely operable for K-12 students.

University Tag Number: 
174606
Availability: 
Contact Custodian for availability
  • Jayma Moore
Location
USDA NCSL Lab
Room Number: 
EM LAB 120
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning

TriboIndenter (Nanomechanical Test Apparatus) Hysitron’s TriboIndenter is capable of performing automated nanomechanical tests on a wide range of materials including thin films and coatings. Elastic modulus, hardness, storage and loss modulus, delamination force, and coefficient of friction are some of the properties that can be determined using the TriboIndenter. In-situ Scanning Probe Microscopy (SPM) can also be performed with nanometer resolution.

University Tag Number: 
173149
Availability: 
Contact Custodian for availability
  • Greg Strommen
Location
Research II
Room Number: 
116
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning

JEOL JSM-7600F high-resolution analytical scanning electron microscope Schottky in-lens field-emission gun Magnification range 25-1 million X Resolution 1 nm at 15 kV, 1.5 nm at 1 kV, 0.8 nm at 30 kV for STEM Thermo energy-dispersive X-ray analysis (silicon drift detector) Detectors: in-lens secondary, in-lens backscatter, low-angle backscatter, in-chamber secondary, STEM Selectable bias to specimen stage for beam deceleration and surface-data enhancement Hysitron PI-85 nanoindenter JEOL IB-09010CP cross-sectional polisher Cressington 208C high-resolution carbon coater

University Tag Number: 
184467
Availability: 
Contact Custodian for availability
  • Jayma Moore
Location
USDA NCSL Lab
Room Number: 
EMC 119
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Detectors

The Symyx Parallel DMTATM system measures the viscoelastic response of an array of 96 polymers or coatings as a function of temperature, or isothermally. Modulus, glass transition temperature (Tg) and crosslink density can be determined for individual samples.

University Tag Number: 
169559
Availability: 
Contact Custodian for availability
  • James Bahr
Location
Research I Addition
Room Number: 
1226
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Transmission

The JEOL JEM-100CX II is a tungsten-filament 100kV transmission electron microscope.  Digital imaging with Gatan Erlangshen ES500W camera, Gatan Digital Micrograph software.

University Tag Number: 
165584
Availability: 
Contact Custodian for availability
  • Jayma Moore
  • Scott Payne
Location
USDA NCSL Lab
Room Number: 
EM Lab 113
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Transmission
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning Transmission

High-resolution 200-kV LaB6 analytical transmission electron microscope system (NSF MRI #0821655).  Energy dispersive X-ray spec­trometry (EDS), scanning transmission electron microscopy (STEM), and parallel electron energy-loss spectrometry (EELS) for micro­analysis.  Mag­ni­fications of 2,000 to 1,500,000 times; optimal resolution 0.23 nm.  Gatan dimple grinder and Gatan Precision Ion Polishing System (PIPS) for sample preparation.

University Tag Number: 
179927
Availability: 
Contact Custodian for availability
  • Jayma Moore
  • Scott Payne
Location
USDA NCSL Lab
Room Number: 
EMC116-117