Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098). Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis. Remotely operable for K-12 students.
TriboIndenter (Nanomechanical Test Apparatus) Hysitron’s TriboIndenter is capable of performing automated nanomechanical tests on a wide range of materials including thin films and coatings. Elastic modulus, hardness, storage and loss modulus, delamination force, and coefficient of friction are some of the properties that can be determined using the TriboIndenter. In-situ Scanning Probe Microscopy (SPM) can also be performed with nanometer resolution.
The Symyx Parallel DMTATM system measures the viscoelastic response of an array of 96 polymers or coatings as a function of temperature, or isothermally. Modulus, glass transition temperature (Tg) and crosslink density can be determined for individual samples.
The JEOL JEM-100CX II is a tungsten-filament 100kV transmission electron microscope. Digital imaging with Gatan Erlangshen ES500W camera, Gatan Digital Micrograph software.
High-resolution 200-kV LaB6 analytical transmission electron microscope system (NSF MRI #0821655). Energy dispersive X-ray spectrometry (EDS), scanning transmission electron microscopy (STEM), and parallel electron energy-loss spectrometry (EELS) for microanalysis. Magnifications of 2,000 to 1,500,000 times; optimal resolution 0.23 nm. Gatan dimple grinder and Gatan Precision Ion Polishing System (PIPS) for sample preparation.
