Scanning

Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning

Variable-pressure analytical scanning electron microscope (NSF MRI Award # 0619098).  Large versatile chamber size. Thermo System Seven EDS system with silicon drift detector for elemental analysis.  Remotely operable for K-12 students.

University Tag Number: 
174606
Availability: 
Contact Custodian for availability
  • Jayma Moore
Location
USDA NCSL Lab
Room Number: 
EM LAB 120
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning

TriboIndenter (Nanomechanical Test Apparatus) Hysitron’s TriboIndenter is capable of performing automated nanomechanical tests on a wide range of materials including thin films and coatings. Elastic modulus, hardness, storage and loss modulus, delamination force, and coefficient of friction are some of the properties that can be determined using the TriboIndenter. In-situ Scanning Probe Microscopy (SPM) can also be performed with nanometer resolution.

University Tag Number: 
173149
Availability: 
Contact Custodian for availability
  • Greg Strommen
Location
Research II
Room Number: 
116
Inventory Classification
  • Materials Characterization
  • Electron/Ion Microscopy
  • Scanning

JEOL JSM-7600F high-resolution analytical scanning electron microscope Schottky in-lens field-emission gun Magnification range 25-1 million X Resolution 1 nm at 15 kV, 1.5 nm at 1 kV, 0.8 nm at 30 kV for STEM Thermo energy-dispersive X-ray analysis (silicon drift detector) Detectors: in-lens secondary, in-lens backscatter, low-angle backscatter, in-chamber secondary, STEM Selectable bias to specimen stage for beam deceleration and surface-data enhancement Hysitron PI-85 nanoindenter JEOL IB-09010CP cross-sectional polisher Cressington 208C high-resolution carbon coater

University Tag Number: 
184467
Availability: 
Contact Custodian for availability
  • Jayma Moore
Location
USDA NCSL Lab
Room Number: 
EMC 119