GE Inspection Technologies v/tome/x s 240kV microfocus X-ray computed tomography system with 180kV nanoCT X-ray and high-contrast digital flat panel detector for detailed non-destructive testing/3D reconstruction. NSF MRI# 1229417.
JEOL's JSM-6010LA InTouchScopeTM Scanning Electron Microscope (SEM) is an analytical, low vacuum SEM featuring integrated Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector (SDD) technology. The JSM-6010LA has the capability of qualitative and quantitative elemental analysis using simultaneous multiple live image and movie capture. The system also comes equipped with an infrared chamberscope and a 6 inch wafer stage.
Veeco Dimension Scanning Probe Microscope (SPM) is a next-generation measurement system that brings new levels of performance, functionality, and accessibility to nanoscale researchers. The Icon system incorporates temperature-compensating position sensors that enable extraordinary performance in a large-sample, closed-loop, 90-micron scan range system.
