GATAN Model 656 Dimple Grinder

Dimple grinding offers a fast and reliable mechanical method of pre-thinning to near electron transparency (in some cases to electron transparency) greatly reducing ion milling times and uneven thinning.  Dimple grinding also offers a means of producing quality TEM specimens having a large central area only a few microns thick surrounded by a robust outer rim. This eliminates special handling techniques for fragile specimens.

The grinding and subsequent polishing with felt wheels provides an exceptionally smooth surface reducing the prospect of surface irregularities developing in the final ion beam thinning operation, increasing the yield of the electron transparent area. A dual measuring system, digital micrometer and analog dial indicator, provides accurate depth and thickness control to within 1 micron.

University Tag Number: 
179924
Availability: 
Contact Custodian for availability
Location
USDA NCSL lab
Room Number: 
EMC 107
Acquisition Date: 
March 19, 2010