Has magnification of 50x, 100x, 250x, 500x and 1,000x. The 8” XY stage features coarse and fine adjustments. Uses computer software which allows image capture and measurement. Also has Infra-red vision and limited fluorescence filter capabilities.
This 2-D detector provides enhanced capabilities for phase ID, phase quantification, texture, stress, small angle x-ray scattering, high-throughput screening, µXRD, and mapping. The instrument can play a significant role in analysis and characterization of many types of materials for research and educational objectives.
XD7600NT X-ray Imaging System DAGE Precision Industries’ XD7600NT X-ray Imaging System is a state-of-the-art inspection tool with submicron feature recognition. X-ray inspection is a critical component in surface mount technology (SMT) and chip scale packaging (CSP). X-ray inspection for SMT processes include solder joints, BGA placement, and solder bridging, while inspection for CSP processes include examination of wire bond connections and wire shorts.
Natural convection ovens that can be used for curing and drying. Temperature range: ambient to 260 °C. Chamber size: 5.6 cu ft. Internal hot plate can be used to decrease bake time when used for soft and hard baking of photoresist.
Hexamethyldisilazane (HMDS) is used to improve photoresist adhesion to the silicon wafers. Programmable cycles for HMDS application. Capable throughput of 400+ wafers per hour.
ZSX Primus X-Ray Fluorescence Spectrometer Rigaku’s ZSX Primus is an X-Ray Fluorescence (XRF) Spectrometer capable of elemental and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology. The ZSX Primus is capable of analyzing elements within the range of Boron through Uranium. The system is capable of analyzing objects less than 50mm in diameter with a spot size of 0.5mm, 1mm, 10mm, 20mm, 30mm, and 40mm. The ZSX is also capable of performing microelemental mapping.
