Contact surface profiler capable of measuring step height, roughness, waviness and other surface characteristics. Has a vertical measurement range from under 100 Å to 300 µm. Has a scan length of 8.1” and a scan speed of 1 to 25 µm/s. Also has a programmable force range of 1 to 50 mg.
KLA-Tencor’s P-15 Longscan Contact Stylus Profiler is capable of measuring the roughness and waviness of a sample’s surface. The P-15 can also measure positive and negative step height features with a high degree of accuracy and precision. Both 2D and 3D scan profiles can be obtained. The P-15 is equipped with a MicroHead IIxr scanner that has a 1mm vertical range and is capable of scanning at forces between 0.5–50mg. The maximum horizontal scan length is 200mm.
LAS-X II laser particle counting spectrometers combine ultra-high sensitivity and great resolution with unprecedented flexibility. The user can select both the number and particle sizes for up to 100 channels, along with any flow rate from 10-100 sccm.
An internal Windows®-based PC controls the spectrometer, providing all the familiar features associated with your personal PC. A 30 GB hard drive, USB keyboard with touchpad, and a 10" color LCD display are included, along with Ethernet and USB ports, 3.5" and CD drives, plus on-board Excel software for data analysis.
The FlowMaster system family is designed to measure instantaneous 2D- and 3D velocity
fields using the well-established Particle Image Velocimetry (PIV) technique. The different types are measurements on a plane/sheet (2D and Stereo-PIV) and in a volume (Tomo-PIV).While 2D-PIV measures both components on a plane, Stereo-PIV measures also the out-of-plane component on a plane. Tomo-PIV measures all three vector components in a volume. For all types the measurements can be performed at either low frame rate ("Low-Speed"-PIV) or at several kHz ("Time-Resolved"-PIV).
The Leica DM2500 P is designed for all routine polarizing examinations in petrography, mineralogy, structure characterization, and examination of liquid crystals and fibers. With versatile instrument options, the Leica DM2500 P polarizing microscope is also an ideal match for industrial analysis and quality control, such as analyzing glass, plastics, textiles and fibers or testing displays in the semiconductor industry. Key Features •Objective turret 5x (M25), centerable •Objectives HI Plan POL, N Plan POL, PL Fluotar POL, Immersion objectives •Usable field of view: 25 mm